Student Final Year Project

Authors
Luk, Kuok Chi
Title
Shearing and peeling stress analysis of chip-subtrate assembly in electronic packaging using FEM
Location
The Library
School
Department of Mechanical Engineering
Year
2011
Call Number
Q624.176 LUK
Abstract

In certain conditions, multi layered materials that undergoes thermal loading will fail, e.g. electronic packaging and composite materials. This mechanical failure is due to a thermal mismatch between the layers of the structure that induces thermal interfacial stress. This stress caused by the differences of coefficients of thermal expansion between the layers.